Structural and electrical characterization of epitaxial, large area ferroelectric films of Ba2Bi4Ti5O18 grown by pulsed excimer laser ablation
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.372263
Reference9 articles.
1. Ferroelectric Memories
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4. Impedance spectroscopy of SrBi2Ta2O9 and SrBi2Nb2O9 ceramics correlation with fatigue behavior
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1. Energy Storage Characteristics and Ferroelectric Properties of La-Doped Bi2sio5 Thin Films;2024
2. Lead-free A2Bi4Ti5O18 thin film capacitors (A = Ba and Sr) with large energy storage density, high efficiency, and excellent thermal stability;Journal of Materials Chemistry C;2019
3. General equivalent circuit derived from capacitance and impedance measurements performed on epitaxial ferroelectric thin films;Journal of Applied Physics;2014-07-28
4. Fabrication and characterization of ferroelectric oxide thin films;Handbook of Thin Films;2002
5. TEM Cross-Section Investigations of Epitaxial Ba2Bi4Ti5O18 Thin Films on LaNiO3 Bottom Electrodes on CeO2/YSZ-Buffered Si(100);Crystal Research and Technology;2000-07
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