Ion channeling, high resolution x-ray diffraction and Raman spectroscopy in strained quantum wells-Reference-Cited by-同舟云学术

Ion channeling, high resolution x-ray diffraction and Raman spectroscopy in strained quantum wells

Published:2001-09-15 Issue:6 Volume:90 Page:2824-2830
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Siddiqui Azher M.,Rao S. V. S. Nageswara,Pathak Anand P.,Kulkarni V. N.,Murthy R. Keshav,Williams Eric,Ila Daryush,Muntele Claudiu,Chandrasekaran K. S.,Arora B. M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1390301

Reference19 articles.

1. Strained‐layer superlattices from lattice mismatched materials

2. Profiling of periodic structures (GaAs–GaAlAs) by nuclear backscattering

3. Ion backscattering and channeling study of InAs‐GaSb superlattices

4. Axial channeling studies of strained-layer superlattices

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