Near-field microwave microscope with improved sensitivity and spatial resolution
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1571954
Reference20 articles.
1. Quantitative imaging of sheet resistance with a scanning near-field microwave microscope
2. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
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4. Anisotropic tuning behavior in epitaxial Ba0.5Sr0.5TiO3 thin films
5. Scanning nonlinear dielectric microscope
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