Processing-induced strains at solder interfaces in extended semiconductor structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2745389
Reference15 articles.
1. Front Matter: Volume 6456
2. By-emitter degradation analysis of high-power laser bars
3. Mechanical stress measurements using micro-Raman spectroscopy
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