The role of probe oxide in local surface conductivity measurements-Reference-Cited by-同舟云学术

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The role of probe oxide in local surface conductivity measurements

Published:2015-05-07 Issue:17 Volume:117 Page:174306
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Barnett C. J.¹,Kryvchenkova O.¹,Wilson L. S. J.¹,Maffeis T. G. G.¹,Kalna K.²,Cobley R. J.¹

Affiliation:

1. Multidisciplinary Nanotechnology Centre, College of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, United Kingdom

2. Electronic Systems Design Centre, College of Engineering, Swansea University, Singleton Park, Swansea SA2 8PP, United Kingdom

Funder

Engineering and Physical Sciences Research Council (EPSRC)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4919662

Reference39 articles.

1. Surface-sensitive conductance measurements

2. Characterization of Semiconductor Surface Conductivity by Using Microscopic Four-Point Probe Technique

3. Resistivity Measurements on Germanium for Transistors

4. Electron Transport at the Nanometer-Scale Spatially Revealed by Four-Probe Scanning Tunneling Microscopy

5. Surface-sensitive conductance measurements on clean and stepped semiconductor surfaces: Numerical simulations of four point probe measurements

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4. Increased Electrical Conductivity of Carbon Nanotube Fibers by Thermal and Voltage Annealing;C;2021-12-23

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