Effect of Dispersion and Geometric Intensity Factors on X‐Ray Back‐Reflection Line Profiles
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1722408
Reference5 articles.
1. Effect of vertical divergence on the displacement and breadth of X-ray powder diffraction lines
2. Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction Maxima
3. A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction Lines
4. Reply to the Resolution of X-ray Doublet Diffraction Lines into 1 2Components
5. Method of Correction for the α1 α2 Doublet in the X‐Ray Diffraction Lines
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A comparison between the variances of the CuKα and FeKα spectral distributions;Journal of Applied Crystallography;1971-02-01
2. Elimination of the dispersion effect in the analysis of diffraction line profiles;Acta Crystallographica;1967-03-10
3. On variance as a measure of line broadening in diffractometry IV. The effect of physical aberrations;Proceedings of the Physical Society;1965-01
4. Conference on X-ray Diffractometry, London, November 1962;British Journal of Applied Physics;1963-05
5. Precision X-Ray Diffractometry Using Powder Specimens;Advances in X-Ray Analysis;1963
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