Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses-Reference-Cited by-同舟云学术

Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Published:2017-03-06 Issue:10 Volume:110 Page:101103
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Patommel Jens¹,Klare Susanne¹,Hoppe Robert¹,Ritter Stephan¹,Samberg Dirk¹,Wittwer Felix¹,Jahn Andreas²,Richter Karola²,Wenzel Christian²,Bartha Johann W.²^ORCID,Scholz Maria³,Seiboth Frank³⁴,Boesenberg Ulrike³,Falkenberg Gerald³,Schroer Christian G.³⁵

Affiliation:

1. Institute of Structural Physics, Technische Universität Dresden, 01062 Dresden, Germany

2. Institute of Semiconductors and Microsystems, Technische Universität Dresden, 01062 Dresden, Germany

3. Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany

4. Linac Coherent Light Source, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA

5. Department Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany

Funder

Bundesministerium für Bildung und Forschung (BMBF)

Helmholtz-Gemeinschaft (HGF)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4977882

Reference29 articles.

1. Focusing X-Ray Beams to Nanometer Dimensions

2. Nanometer Spatial Resolution Achieved in Hard X-Ray Imaging and Laue Diffraction Experiments

3. A compound refractive lens for focusing high-energy X-rays

4. Nanofocusing parabolic refractive x-ray lenses

5. Resolution Limit of Refractive Lens and Fresnel Lens in X-Ray Region

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