Electro-optic coefficients of Si0.75Ge0.25∕Si∕Si0.5Ge0.5 asymmetric superlattice measured by polarization-maintaining fiber-optic Mach-Zehnder interferometer
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2358319
Reference28 articles.
1. Nonlinear optics using semiconductor quantum wells
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5. X-Ray scattering investigation of the interfaces in Si/Si1−xGex superlattices on Si(001) grown by MBE and UHV-CVD
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