Portable x-ray fluorescence spectrometer for coating thickness measurement-Reference-Cited by-同舟云学术

Portable x-ray fluorescence spectrometer for coating thickness measurement

Published:2007-12 Issue:12 Volume:78 Page:123109
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Carapelle Alain,Fleury-Frenette Karl,Collette Jean-Paul,Garnir Henri-Pierre,Harlet Philippe

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2822613

Reference11 articles.

1. A table‐top x‐ray microbeam scanning facility

2. A miniature x-ray fluorescence setup

3. A portable XRF spectrometer for non-destructive analyses in archaeometry

4. D. Strivay, G. Weber, A. Marchal, M. Clar, and H.P. Garnir, In Situ Non-Destructive Analysis and Testing of Museum Objects, Bratislava (Slovaquie), April 2005.

5. Silicon drift detectors for high resolution room temperature X-ray spectroscopy

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