Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device-Reference-Cited by-同舟云学术

Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device

Published:2011-04 Issue:7 Volume:109 Page:073304
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Sakaue H. A.,Yamamoto N.,Morita S.,Nakamura N.,Chen C.,Kato D.,Kikuchi H.,Murakami I.,Ohtani S.,Tanuma H.,Watanabe T.,Tawara H.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3549707

Reference29 articles.

1. Wavelengths and Intensities of Spectral Lines in the 171–211 and 245–291 Å Ranges from Five Solar Regions Recorded by the Extreme‐Ultraviolet Imaging Spectrometer (EIS) onHinode

2. Laboratory X-Ray Astrophysics

3. Experimental and Theoretical Evaluation of Density‐sensitive Nvi, Arxiv, and FexxiiLine Ratios

4. ELECTRON DENSITY DIAGNOSTIC FOR HOT PLASMAS IN THE CORONAL REGIME BY USING B-LIKE IONS

5. EXPERIMENTAL INVESTIGATIONS OF ION CHARGE DISTRIBUTIONS, EFFECTIVE ELECTRON DENSITIES, AND ELECTRON-ION CLOUD OVERLAP IN ELECTRON BEAM ION TRAP PLASMA USING EXTREME-ULTRAVIOLET SPECTROSCOPY

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