Ion Microprobe Mass Analyzer
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1709314
Reference22 articles.
1. Étude d’une méthode d’analyse locale chimique et isotopique utilisant l’émission ionique secondaire
2. Sputtering of Surfaces by Positive Ion Beams of Low Energy
3. Secondary Positive Ion Emission from Metal Surfaces
4. Secondary Positive Ion Emission from Metal Surfaces
5. On the Yield and Energy Distribution of Secondary Positive Ions from Metal Surfaces
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