Use of the drift-time method to measure the electron lifetime in long-drift-length CdZnTe detectors-Reference-Cited by-同舟云学术

Use of the drift-time method to measure the electron lifetime in long-drift-length CdZnTe detectors

Published:2016-09-14 Issue:10 Volume:120 Page:104507
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:J. Appl. Phys.

Author:

Bolotnikov A. E.¹,Camarda G. S.¹,Chen E.²,Gul R.¹,Dedic V.¹³,De Geronimo G.¹,Fried J.¹,Hossain A.¹,MacKenzie J. M.²,Ocampo L.¹⁴,Sellin P.⁵,Taherion S.²,Vernon E.¹,Yang G.¹,El-Hanany U.²^ORCID,James R. B.¹⁶

Affiliation:

1. Brookhaven National Laboratory, Upton, New York 11793, USA

2. Redlen Technologies, Saanichton, British Columbia V8M 0A5, Canada

3. Institute of Physics of Charles University, Prague 12116, Czech Republic

4. Department of Mechanical and Nuclear Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, USA

5. Department of Physics, University of Surrey, Surrey GU2 7XH, United Kingdom

6. Science and Technology Directorate, Savannah River National Laboratory, Aiken, South Carolina 29808, USA

Funder

Brookhaven National Laboratory (BNL)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference7 articles.

1. Zum Mechanismus des lichtelektrischen Prim�rstromes in isolierenden Kristallen

2. G. Knoll , Radiation Detection and Measurement, 3rd ed. ( Wiley, New York, 2000), p. 480.

3. Direct measurement of product of the electron mobility and mean free drift time of CdZnTe semiconductors using position sensitive single polarity charge sensing detectors

4. Purification techniques and purity and density measurements of high-pressure Xe

5. Design, construction and tests of the ICARUS T600 detector

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