Dependence of threshold thickness of crystallization and film morphology on film processing conditions in poly(vinylidene fluoride–trifluoroethylene) copolymer thin films-Reference-Cited by-同舟云学术

Dependence of threshold thickness of crystallization and film morphology on film processing conditions in poly(vinylidene fluoride–trifluoroethylene) copolymer thin films

Published:2002-09-15 Issue:6 Volume:92 Page:3111-3115
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Xia Feng,Razavi B.,Xu Haisheng,Cheng Z.-Y.,Zhang Q. M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1503395

Reference23 articles.

1. Poled polymers for sensors and photonic applications

2. Corona-poled piezoelectric polymer layers of P(VDF/TrFE) for micromachined silicon microphones

3. Monolithic pyroelectric infrared image sensor using PVDF thin film

4. The Physics of Ferroelectric Memories

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