Comparative studies of tunnel injection and irradiation on metal oxide semiconductor structures
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.330038
Reference13 articles.
1. Avalanche Injection of Holes into SiO2
2. Carrier Injection into SiO2from Si Surface Driven to Avalanche Breakdown by a Linear Ramp Pulse, and Trapping, Distribution and Thermal Annealing of Injected Holes in SiO2
3. An Electrical Technique to Measure the Radiation Susceptibility of MOS Gate Insulators
4. Impact ionization in silicon dioxide at fields in the breakdown range
5. Impact ionization and positive charge in thin SiO2films
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