Nb/a-Si/Nb Josephson junctions for high-density superconducting circuits
Author:
Affiliation:
1. Department of Physics, University of Colorado 1 , Boulder, Colorado 80309, USA
2. RF Technology Division, National Institute of Standards and Technology 2 , Boulder, Colorado 80305, USA
Abstract
Funder
Intelligence Advanced Research Projects Activity
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0148250/17176842/182601_1_5.0148250.pdf
Reference32 articles.
1. Increasing integration scale of superconductor electronics beyond one million Josephson junctions;J. Phys.: Conf. Ser.,2020
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3. Plasma process-induced damage to josephson tunnel junctions in superconducting integrated circuits;Supercond. Sci. Technol.,2007
4. 1 V and 10 V SNS programmable voltage standards for 70 GHz;IEEE Trans. Appl. Supercond.,2009
5. Observation of multiple Andreev reflections in superconducting tunnel junctions;Phys. Rev. Lett.,1994
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