Accurate determination of the thickness or mass per unit area of thin foils and single-crystal wafers for x-ray attenuation measurements
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1781383
Reference21 articles.
1. X-ray extended-range technique for precision measurement of the X-ray mass attenuation coefficient and Im(f) for copper using synchrotron radiation
2. Measurement of the x-ray mass attenuation coefficient of copper using 8.85–20 keV synchrotron radiation
3. X-Ray Mass Attenuation Coefficient of Silicon: Theory versus Experiment
4. Measurement of the x-ray mass attenuation coefficient and the imaginary part of the form factor of silicon using synchrotron radiation
5. X-ray attenuation coefficients of carbon in the energy range 5 to 20 keV
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