Recovery process of degraded ferroelectric properties in the forming-gas-annealed Pt/Bi4−xLaxTi3O12/Pt capacitor
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1558970
Reference12 articles.
1. Lanthanum-substituted bismuth titanate for use in non-volatile memories
2. Fatigue-free behavior of highly oriented Bi3.25La0.75Ti3O12 thin films grown on Pt/Ti/SiO2/Si(100) by metalorganic solution decomposition
3. Fatigue-free ferroelectric capacitors with platinum electrodes
4. Studies of hydrogen-induced degradation processes in SrBi2Ta2O9 ferroelectric film-based capacitors
5. Degradation of ferroelectric SrBi2Ta2O9 materials under reducing conditions and their reaction with Pt electrodes
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1. Effects of ultraviolet irradiation and soak time on the leakage current of Bi3.25La0.75Ti3O12 thin films;physica status solidi (c);2011-08-03
2. Annealing Temperature Effect on Internal Strain and Ferroelectric Properties of Bi3.25La0.75Ti3O12Thin Films;Ferroelectrics;2010-09-21
3. STRESS EFFECTS ON Bi3.25La0.75Ti3O12 THIN FILMS;Integrated Ferroelectrics;2006-11
4. Stress effects on ferroelectric and fatigue properties of Nd- and La-doped Bi4Ti3O12 thin films;Applied Physics Letters;2005-02-28
5. Thickness dependence of the ferroelectric PbTiO3 thin films on the dipolar relaxation in the microwave-frequency range;Applied Physics Letters;2004-09-20
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