A general approach to obtain soft x-ray transparency for thin films grown on bulk substrates-Reference-Cited by-同舟云学术

A general approach to obtain soft x-ray transparency for thin films grown on bulk substrates

Published:2017-10 Issue:10 Volume:88 Page:103701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Fohler Manuel¹²^ORCID,Frömmel Stefanie¹,Schneider Michael¹³,Pfau Bastian³,Günther Christian M.¹³^ORCID,Hennecke Martin³^ORCID,Guehrs Erik¹,Shemilt Laura¹,Mishra Durgamadhab²,Berger Dirk⁴,Selve Sören⁴,Mitin Dmitriy⁵,Albrecht Manfred⁵,Eisebitt Stefan¹³

Affiliation:

1. Institut für Optik und Atomare Physik, Technische Universität Berlin, Straße des 17. Juni 135, 10623 Berlin, Germany

2. Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany

3. Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Max-Born-Straße 2A, 12489 Berlin, Germany

4. Zentraleinrichtung Elektronenmikroskopie, Technische Universität Berlin, Straße des 17. Juni 135, 10623 Berlin, Germany

5. Institut für Physik, Experimentalphysik IV, Universität Augsburg, Universitätsstraße 1 Nord, 86159 Augsburg, Germany

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5006522

Reference35 articles.

1. Electronic Structure of Individual Hybrid Colloid Particles Studied by Near-Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy in the X-ray Microscope

2. Investigation of reactions between trace gases and functional CuO nanospheres and octahedrons using NEXAFS-TXM imaging

3. Overview of nanoscale NEXAFS performed with soft X-ray microscopes

4. Influence of stray fields on the switching-field distribution for bit-patterned media based on pre-patterned substrates

5. High-Resolution X-Ray Lensless Imaging by Differential Holographic Encoding

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