Instrumentation for dual-probe scanning near-field optical microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4737883
Reference42 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
3. Tunneling Spectroscopy and Inverse Photoemission: Image and Field States
4. Real-Space Observation of Surface States on Si(111) 7×7 with the Tunneling Microscope
5. Kelvin probe force microscopy
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