Friction effects in the deflection of atomic force microscope cantilevers
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145144
Reference14 articles.
1. Novel optical approach to atomic force microscopy
2. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
3. From molecules to cells: imaging soft samples with the atomic force microscope
4. The influence of lateral forces in scanning force microscopy
5. Atomic force microscopy of deoxyribonucleic acid strands adsorbed on mica: The effect of humidity on apparent width and image contrast
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