New imaging bandpass electron energy analyzer
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1138574
Reference9 articles.
1. Electron emission microscopy in retrospect and prospect
2. Microscope photoélectronique pour l'analyse chimique des surfaces
3. The collimating and magnifying properties of a superconducting field photoelectron spectrometer
4. Electron beam spectroscopy
5. Characteristics of the 180 degrees backscattering trochoidal spectrometer
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