A spectroscopic ellispometric study of the tunability of the optical constants and thickness of GeOx films with swift heavy ions
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3638700
Reference37 articles.
1. Low-loss GeO_2 optical waveguide fabrication using low deposition rate rf sputtering
2. Thermal changes of optical properties observed in some suboxide thin films
3. Optical functions of (x)GeO2:(1-x)SiO2 films determined by multi-sample and multi-angle spectroscopic ellipsometry
4. Structure and photoluminescence properties of evaporated GeOx thin films
5. Ge nanocrystals embedded in a GeOx matrix formed by thermally annealing of Ge oxide films
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1. Tailoring of structural and optical properties of GeOx thin films using 100 MeV Si ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-09
2. Growth mechanism and optical properties of Ge nanocrystals embedded in a GeOx matrix;Applied Physics A;2018-09-24
3. Ion beam modification of structural and optical properties of GeO2 thin films deposited at various substrate temperatures using pulsed laser deposition;Applied Physics A;2017-10-20
4. Spetroscopic ellipsometry study on electrical and elemental properties of Sb-doped ZnO thin films;Current Applied Physics;2015-04
5. Effect of Thermal Annealing and Swift Heavy Ion Irradiation on the Optical Properties of Indium Oxide Thin Films;ECS Journal of Solid State Science and Technology;2013-12-14
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