Sliding ferroelectricity in kagome-B2X3 (X = S, Se, Te) bilayers

Author:

Guo Yan-Dong12ORCID,Meng Rui-Jie1,Hu Xue-Qin1,Lin Li-Yan1,Jiang Yue23ORCID,Yang Ming-Yu1ORCID,You Yun1,Zhang Lan-Qi1ORCID,Xu Yi-Long1,Yan Xiao-Hong1245

Affiliation:

1. College of Electronic and Optical Engineering, Nanjing University of Posts and Telecommunications 1 , Nanjing 210046, China

2. Key Laboratory of Radio Frequency and Micro-Nano Electronics of Jiangsu Province 2 , Nanjing 210023, China

3. College of Science, Jinling Institute of Technology 3 , Nanjing 211169, China

4. College of Science, Nanjing University of Aeronautics and Astronautics 4 , Nanjing 210016, China

5. School of Material Science and Engineering, Jiangsu University 5 , Zhenjiang 212013, China

Abstract

Different from the honeycomb monolayer (like graphene), the single-layer boron chalcogenide B2X3 (X = S, Se, Te) exhibits a kagome lattice. Using the first-principles calculations, the existence of sliding ferroelectricity in van der Waals kagome-B2X3 bilayers is demonstrated. The sliding ferroelectricity results from the breaking of the inversion symmetry by interlayer sliding. In addition, there are multiple stable states in a unit cell for kagome-lattice bilayers. The bandgap is found to vary with sliding distance. By choosing specific pathways, not only the out-of-plane polarization but also the in-plane polarization can be reversed by interlayer sliding. Such a simultaneous reversal for both in-plane and out-of-plane polarizations by sliding would be useful for applications in various devices. These behaviors are found in all the three configurations (X = S, Se, Te), suggesting they are the intrinsic features of such systems and may throw light on the development of future devices.

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Publisher

AIP Publishing

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ferroelectric metals in van der Waals bilayers;Applied Physics Letters;2024-06-17

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