Limitations upon photoinjection studies of charge distributions close to interfaces in MOS capacitors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1661891
Reference4 articles.
1. Photoinjection Studies of Charge Distributions in Oxides of MOS Structures
2. Predicted Effect of Exponential Charging Profiles on Photoinjected Currents in Silicon Dioxide
3. Photoinjection into SiO2: Electron Scattering in the Image Force Potential Well
4. Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon
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4. Effect of Deep-Level Defects on Surface Recombination Velocity at the Interface Between Silicon and Dielectric Films;IEEE Transactions on Electron Devices;2010-04
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