Improved on-state performance of AlGaN/GaN Fin-HEMTs by reducing the length of the nanochannel

Author:

Zhang Meng12,Ma Xiao-Hua12,Mi Min-Han23,He Yun-Long12,Hou Bin12,Zheng Jia-Xin12,Zhu Qing12ORCID,Chen Li-Xiang12,Zhang Peng12,Yang Ling12

Affiliation:

1. School of Advanced Materials and Nanotechnology, Xidian University, Xi'an 710071, People's Republic of China

2. Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices, School of Microelectronics, Xidian University, Xi'an 710071, People's Republic of China

3. School of Mechano-electric Engineering, Xidian University, Xi'an 710071, People's Republic of China

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. On-state performance enhancement of AlGaN/GaN Fin-HEMTs by using arcuate sidewalls;Applied Physics Letters;2024-08-05

2. Dependence of Device Performances on Fin Ratios of AlGaN/GaN Nanoscale Fin-HEMTs;ECS Journal of Solid State Science and Technology;2023-09-01

3. Noise performance of back‐barrier engineered GaN‐based trigate HEMT for X‐band applications;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2023-07-30

4. DC and RF performance of lateral AlGaN/GaN FinFET with ultrathin gate dielectric;Semiconductor Science and Technology;2022-06-23

5. GaN based trigate HEMT with AlGaN back-barrier layer: proposal and investigation;Semiconductor Science and Technology;2022-05-05

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