Over 20% wall plug efficiency of on-wafer GaN-based vertical-cavity surface-emitting laser

Author:

Watanabe Ruka1ORCID,Kobayashi Kenta1ORCID,Yanagawa Mitsuki1,Takeuchi Tetsuya1ORCID,Kamiyama Satoshi1,Iwaya Motoaki1ORCID,Kamei Toshihiro2

Affiliation:

1. Department of Materials Science and Engineering, Meijo University 1 , 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan

2. Research Institute for Advanced Electronics and Photonics, National Institute of Advanced Industrial Science and Technology (AIST) 2 , 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

Abstract

We demonstrated an over 20% wall plug efficiency of an on-wafer GaN-based vertical-cavity surface-emitting laser (VCSEL) with a 5 μm aperture. The cavity length of the VCSEL was 4λ optical length, containing a 3.7λ part of GaN-based layers controlled with an in situ reflectivity spectra measurement and a 0.3λ part of an ITO electrode and a Nb2O5 spacer layer adjusted with an ex situ measurement. In order to calibrate the thickness of ITO and N2O5, we directly evaluated resonance wavelength shifts of a 4λ GaN cavity test structure with additional ITO or N2O5 depositions on the cavity. We then fabricated GaN-based VCSELs with various aperture sizes from 5 to 20 μm by implementing the tuned ITO electrode and the tuned N2O5 spacer layer into the 4λ cavity of the VCSELs. The GaN-based VCSEL with an 8 μm aperture showed a light output power of 13.1 mW and an emission wavelength of 417.7 nm, which was only a 0.3 nm away from a designed wavelength.

Funder

Japan Society for the Promotion of Science

Publisher

AIP Publishing

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