Scanning Raman picoscopy: Ångström-resolved tip-enhanced Raman spectromicroscopy-Reference-Cited by-同舟云学术

Scanning Raman picoscopy: Ångström-resolved tip-enhanced Raman spectromicroscopy

Published:2021-02 Issue:1 Volume:34 Page:1-14
ISSN:1674-0068
Container-title:Chinese Journal of Chemical Physics
language:en
Short-container-title:Chinese Journal of Chemical Physics

Author:

Zhang Yao¹,Zhang Yang¹,Dong Zhen-chao¹

Affiliation:

1. Hefei National Laboratory for Physical Sciences at the Microscale and Synergetic Innovation Center of Quantum Information and Quantum Physics, Department of Chemical Physics, University of Science and Technology of China, Hefei 230026, China

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry

Link

https://cps.scitation.org/doi/pdf/10.1063/1674-0068/cjcp2102027

Reference84 articles.

1. Metallized tip amplification of near-field Raman scattering

2. Nanoscale chemical analysis by tip-enhanced Raman spectroscopy

3. Locally enhanced Raman spectroscopy with an atomic force microscope

4. Surface Enhanced Raman Spectroscopy: Towards Single Molecule Spectroscopy

5. High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes

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