1. E. P. Bertn,Principles and Practices of X-Ray Spectrometrie Analysis, 2nd ed. (Plenum, New York, 1975), p. 200.
2. D. B. Wittry and D. M. Golijanin, inProceedings of 11th International Congress on X-Ray Optics and Microanalysis, edited by J. D. Brown and R. H. Packwood (available from J. D. Brown, Faculty of Engineering Science, University of Western Ontario, London, Ontario, 1986), pp. 51–55.