Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method-Reference-Cited by-同舟云学术

Influence of noncontact dissipation in the tapping mode: Attempt to extract quantitative information on the surface properties with the local force probe method

Published:2001-03-15 Issue:11 Volume:114 Page:4945-4954
ISSN:0021-9606
Container-title:The Journal of Chemical Physics
language:en
Short-container-title:The Journal of Chemical Physics

Author:

Aimé J. P.,Boisgard R.,Nony L.,Couturier G.

Publisher

AIP Publishing

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1349179

Reference35 articles.

1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

2. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

3. Observation of Silicon Surfaces Using Ultrahigh-Vacuum Noncontact Atomic Force Microscopy

4. Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy

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