Influence of dielectric constant on dielectric strength by defect discharge and molecular polarization in solid insulation materials
Author:
Affiliation:
1. Science and Technology on High Power Microwave Laboratory, Northwest Institute of Nuclear Technology, Xi’an, Shaanxi 710024, China
2. State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871, China
Funder
National Natural Science Foundation of China
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5086377
Reference26 articles.
1. Research on Reliability and Lifetime of Solid Insulation Structures in Pulsed Power Systems
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5. Complementary model for intrinsic time-dependent dielectric breakdown in SiO2 dielectrics
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