Quantitative analysis of effective height of probes in microwave impedance microscopy-Reference-Cited by-同舟云学术

Quantitative analysis of effective height of probes in microwave impedance microscopy

Author:

Wei Zhun¹,Ma Eric Yue²,Cui Yong-Tao²,Johnston Scott²,Yang Yongliang²,Agarwal Krishna³^ORCID,Kelly Michael A.²^ORCID,Shen Zhi-Xun²,Chen Xudong¹

Affiliation:

1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583, Singapore

2. Department of Applied Physics and Geballe Laboratory for Advanced Materials, Stanford University, Stanford, California 94305, USA

3. Singapore-MIT Alliance for Research and Technology (SMART) Centre, CREATE Tower, Singapore 138602, Singapore

Funder

NSF

National Research Foundation Singapore (NRF)

Gordon and Betty Moore Foundation (Gordon E. and Betty I. Moore Foundation)

Publisher

AIP Publishing

Subject

Instrumentation

Link

Reference36 articles.

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1. Advanced Microwave Impedance Microscopy for Emerging Materials and Devices;2024 IEEE/MTT-S International Microwave Symposium - IMS 2024;2024-06-16