Near-field radiation analysis and thermal contact radius determination in the thermal conductivity measurement based on SThM open-loop system

Author:

Liu Zihan1,Feng Yanhui12ORCID,Qiu Lin12ORCID

Affiliation:

1. School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing 100083, China

2. Beijing Key Laboratory of Energy Saving and Emission Reduction for Metallurgical Industry, University of Science and Technology Beijing, Beijing 100083, China

Abstract

With the rapid development of materials science, plenty of materials with micro-nano structures are emerging in various fields due to their outstanding physical properties. In order to fulfill the needs of micro-nano-scale thermal measurement, a series of thermophysical characterization methods have been evolving. In this article, a measurement method based on the Scanning Thermal Microscopy open-loop system is proposed to realize nano-scale thermal conductivity characterization. Both forward and backward thermal contact radius are measured. The heat transfer tunnel raised by the near-field radiation is calculated to be 1.73 × 10−14 W/K as the upper limit, which can be neglected compared to the total value. The total thermal conductance between tip and sample was calibrated as 1.8 × 10−6 W/K by several standard bulk samples, and thermal conductivity varies from 0.28 to 237 Wm−1 K−1.

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Beijing Nova Program

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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