Glovebox-assisted magnetic force microscope for studying air-sensitive samples in a cryogen-free magnet

Author:

Zhang Yuchen1ORCID,Zhao Kesen12,Zheng Shaofeng1ORCID,Wang Jihao32ORCID,Zhang Jing32ORCID,Feng Qiyuan32,Wang Ze2,Gao Jianhua32,Hou Yubin32ORCID,Meng Wenjie32ORCID,Lu Yalin14ORCID,Lu Qingyou1324ORCID

Affiliation:

1. University of Science and Technology of China 1 , Hefei, Anhui 230026, People’s Republic of China

2. The High Magnetic Field Laboratory of Anhui Province 3 , Hefei, Anhui 230031, People’s Republic of China

3. 2 Anhui Key Laboratory of Low-energy Quantum Materials and Devices, High Magnetic Field Laboratory, HFIPS, Chinese Academy of Sciences, Hefei, Anhui 230031, People's Republic of China

4. Anhui Laboratory of Advanced Photon Science and Technology, University of Science and Technology of China 4 , Hefei, Anhui 230026, People’s Republic of China

Abstract

Most known two-dimensional magnets exhibit a high sensitivity to air, making direct characterization of their domain textures technically challenging. Herein, we report on the construction and performance of a glovebox-assisted magnetic force microscope (MFM) operating in a cryogen-free magnet, realizing imaging of the intrinsic magnetic structure of water and oxygen-sensitive materials. It features a compact tubular probe for a 50 mm-diameter variable temperature insert installed in a 12 T cryogen-free magnet. A detachable sealing chamber can be electrically connected to the tail of the probe, and its pump port can be opened and closed by a vacuum manipulator located on the top of the probe. This sealing chamber enables sample loading and positioning in the glove box and MFM transfer to the magnet maintained in an inert gas atmosphere (in this case, argon and helium gas). The performance of the MFM is demonstrated by directly imaging the surface (using no buffer layer, such as h-BN) of very air-sensitive van der Waals magnetic material chromium triiodide (CrI3) samples at low temperatures as low as 5 K and high magnetic fields up to 11.9 T. The system’s adaptability permits replacing the MFM unit with a scanning tunneling microscope unit, enabling high-resolution atomic imaging of air-sensitive surface samples.

Publisher

AIP Publishing

Subject

Instrumentation

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