Solid state reaction at the interface between Heusler alloys and Al cap accelerated by elevated temperature and rough surface-Reference-Cited by-同舟云学术

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Solid state reaction at the interface between Heusler alloys and Al cap accelerated by elevated temperature and rough surface

Published:2007-11-05 Issue:19 Volume:91 Page:192501
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kallmayer M.,Hild K.,Eichhorn T.,Schneider H.,Jakob G.,Conca A.,Jourdan M.,Elmers H. J.,Gloskovskii A.,Schuppler S.,Nagel P.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2805812

Reference27 articles.

1. Electronic structure and Slater–Pauling behaviour in half-metallic Heusler alloys calculated from first principles

2. Calculated electronic and magnetic properties of the half-metallic, transition metal based Heusler compounds

3. J. M. D. Coey, M. Venkatesan, and M. A. Bari, inLecture Notes in Physics, edited by C. Berthier, L. P. Levy, and G. Martinez (Springer, Heidelberg, 2002), Vol. 595, pp. 377–396.

4. 175% tunnel magnetoresistance at room temperature and high thermal stability using Co2FeAl0.5Si0.5 full-Heusler alloy electrodes

5. Structural and magnetic properties and tunnel magnetoresistance for Co2(Cr,Fe)Al and Co2FeSi full-Heusler alloys

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Element-Specific Magnetic and Electronic Properties of Epitaxial Heusler Films;Heusler Alloys;2015-11-13

2. New Materials with High Spin Polarization Investigated by X-Ray Magnetic Circular Dichroism;Spintronics;2013

3. Ferromagnetic Heusler Alloy Thin Films: Electronic Properties and Magnetic Moment Formation;Springer Tracts in Modern Physics;2012-09-15

4. Element-specific magnetic properties of Co2(Mn1−xFex)Si films probed by x-ray magnetic circular/linear dichroism;Physical Review B;2011-08-15

5. Tailoring the electronic structure of half-metallic Heusler alloys;Physical Review B;2009-10-09

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