Piezoelectric property in morphotropic phase boundary Bi0.5(Na0.82K0.18)0.5TiO3 lead free thick film deposited by screen printing
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2911744
Reference24 articles.
1. Thick film PZT/micromachined silicon accelerometer
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2. Refractive index and domain structure of undoped and Nb doped (Na0.41K0.09Bi0.50)TiO3 (NBT-KBT) single crystal grown at MPB composition;Optical Materials;2022-11
3. A correlation between depolarization temperature, ergodicity and piezoelectric response in Nb5+-substituted (Na0.41K0.09Bi0.50)TiO3;Journal of Materials Research;2021-07-20
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