True-molecular resolution imaging by frequency modulation atomic force microscopy in various environments
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1852721
Reference15 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
3. Molecular-scale non-contact AFM studies of ferroelectric organic thin films epitaxially grown on alkali halides
4. Cu-TBPP and PTCDA molecules on insulating surfaces studied by ultra-high-vacuum non-contact AFM
5. Atom-Resolved Image of theTiO2(110)Surface by Noncontact Atomic Force Microscopy
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