Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1304866
Reference21 articles.
1. Parameter control, characterization, and optimization in the fabrication of optical fiber near-field probes
2. Progress of high-resolution photon scanning tunneling microscopy due to a nanometric fiber probe
3. A simple chemical etching technique for reproducible fabrication of robust scanning near-field fiber probes
4. Simple device and reproducible approach for producing high efficiency optical fiber tips for a scanning near-field optical microscope
5. High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling
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