A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3124183
Reference19 articles.
1. Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation
2. Iterative Control Approach to Compensate for Both the Hysteresis and the Dynamics Effects of Piezo Actuators
3. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy
4. Tapping mode atomic force microscopy in liquids
5. Proceedings of the American Control Conference;Rifai O. M. E.,2001
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