Author:
Vivet L.,Dubreuil B.,Gibert-Legrand T.,Barthe M. F.
Subject
General Physics and Astronomy
Reference23 articles.
1. Soft laser sputtering of GaAs semiconductor (100) surface
2. Resonance ionization mass spectrometry of AlxGa_1−xAs: depth resolution, sensitivity, and matrix effects
3. Sputtering processes in AlxGa1−xAs and the effects on post-ionization detection
4. Soft laser sputtering of InP(100) surface
5. S. W. Downey and R. S. Hozak, inSecondary Ion Mass Spectrometry, SIMS VII, edited by A. Benninghoven, C. A. Evans, A. M. Huber, K. McKeegan, H. A. Stroms, and H. W. Werner (Wiley, New York, 1990), p. 283.
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献