An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4821146
Reference32 articles.
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4. Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
5. In-situ determination of dispersion and resolving power in simultaneous multiple-angle XUV spectroscopy
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