1. Proceedings of the Ninth IEEE Photovoltaic Specialists Conference;Crabb R. L.,1972
2. Minority carrier lifetime degradation in boron-doped Czochralski silicon
3. J. Schmidt, A. G. Aberle, and R. Hezel, Proceedings of the 26th IEEE Photovoltaic Specialists Conference, Anaheim, CA (IEEE, New York, 1997), p. 13.
4. S. W. Glunz, S. Rein, W. Warta, J. Knobloch, and W. Wettling, Proceedings of the Second World Conference on Photovoltaic Energy Conversion, Vienna, Austria (European Commission, Ispra, Italy, 1998), p. 1343.
5. Structure and transformation of the metastable boron- and oxygen-related defect center in crystalline silicon