Microwave Measurement of Semiconductor Carrier Lifetimes
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1735726
Reference4 articles.
1. Microwave Techniques in Measurement of Lifetime in Germanium
2. Electron-Hole Recombination in Germanium
3. Statistics of the Recombinations of Holes and Electrons
4. Transient Recombination of Excess Carriers in Semiconductors
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