Simulation of proton-induced primary displacement damage in GaAs under different ambient temperatures

Author:

Xing Tian1ORCID,Liu Shuhuan1,Song Ci2,Wang Xuan1ORCID,Adekoya Mathew Adefusika1ORCID,Wang Chao1,Li Haodi1ORCID,Meng Fanjun1,Du Xiaozhi1ORCID,Sun Yunfeng1,Zhu Shijie1,Wang Lipeng3,Chen Wei3,Li Kang4,Zheng Xiaohai4

Affiliation:

1. Department of Nuclear Science and Technology, Xi’an Jiaotong University 1 , Xi’an 710049, China

2. State Key Lab of Electrical Insulation and Power Equipment, Xi’an Jiaotong University 2 , Xi’an 710049, China

3. Northwest Institute of Nuclear Technology 3 , Xi’an 710024, China

4. Xi’an Guanneng Neutron Detection Technology Co., Ltd. 4 , Xi’an 710123, China

Abstract

The performance of on-orbit GaAs-based solar cells is susceptible to the displacement damage effect. The proton-induced primary displacement damage in GaAs on a geosynchronous equatorial orbit (GEO) was simulated and analyzed by combining the Monte Carlo (MC) and molecular dynamics (MD) methods. The MC simulation provided the distribution of primary knock-on atoms (PKAs) in GaAs induced by GEO-related protons to the MD simulation. In MD simulations, the effects of radiation fluence and ambient temperature on the displacement damage were considered. The simulation results showed that GEO-related protons generated a significant number of PKAs within an energy range of below 10 keV in GaAs. The high-fluence radiation emulated by the binary PKA could generate more point defects and cluster defects in GaAs than the low-fluence radiation emulated by single PKAs. As compared to room temperature (300 K), both a low (100 K) and high (500 K) ambient temperature could deteriorate the displacement damage. In addition, a high ambient temperature of 500 K could induce widespread thermal spikes in GaAs as compared to 100 and 300 K. This work can provide useful insight into the proton-induced displacement damage in GaAs and the radiation hardening of GaAs-based photoelectric devices in space.

Publisher

AIP Publishing

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