Chemical bonding state analysis of silicon carbide layers in Mo/SiC/Si multilayer mirrors by soft x-ray emission and absorption spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1318231
Reference8 articles.
1. Design and fabrication of highly heat-resistant Mo/Si multilayer soft X-ray mirrors with interleaved barrier layers
2. Buried Interfaces in Mo/Si Multilayers Studied by Soft-X-Ray Emission Spectroscopy
3. First experimental results from IBM/TENN/TULANE/LLNL/LBL undulator beamline at the advanced light source
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