Transmission low-energy electron diffraction using double-gated single nanotip field emitter-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Transmission low-energy electron diffraction using double-gated single nanotip field emitter

Published:2018-07-02 Issue:1 Volume:113 Page:013505
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lee Chiwon¹^ORCID,Tsujino Soichiro²,Miller R. J. Dwayne¹³^ORCID

Affiliation:

1. Max Planck Institute for the Structure and Dynamics of Matters, Luruper Chausee 149, 22607 Hamburg, Germany

2. Laboratory for Micro and Nanotechnology, Photon Science Division, Paul Scherrer Institut, Villigen 5232, Switzerland

3. Departments of Chemistry and Physics, University of Toronto, Toronto, M5S 3H6 Ontario, Canada

Funder

Max-Planck-Gesellschaft

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5030889

Reference22 articles.

1. The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules

2. On the physics of ultrashort single-electron pulses for time-resolved microscopy and diffraction

3. Femtosecond Crystallography with Ultrabright Electrons and X-rays: Capturing Chemistry in Action

4. Capturing Chemistry in Action with Electrons: Realization of Atomically Resolved Reaction Dynamics

5. The structural study of membrane proteins by electron crystallography

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Maximizing the notional area in single tip field emitters;Ultramicroscopy;2024-09

2. Beam Divergence and Interference Characteristics of Field Emission Beam: Effects of Transverse Momentum and Source Spatial Coherence;2024 37th International Vacuum Nanoelectronics Conference (IVNC);2024-07-15

3. High bunch charge low-energy electron streak diffraction;Structural Dynamics;2024-03-01

4. Fast and accurate determination of the curvature-corrected field emission current;Journal of Applied Physics;2023-03-07

5. On the brightness, transverse emittance, and transverse coherence of field emission beam;Journal of Vacuum Science & Technology B;2022-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3