An FT‐IR based instrument for measuring spectral emittance of material at high temperature
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1141538
Reference10 articles.
1. Method for Measuring High Temperature Spectral Emissivity of Nonconducting Materials
2. A method for measuring optical properties of semitransparent materials at high temperatures
3. System for the Measurement of Spectral Emittance at High Temperature
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