An optimized scheme for detecting magneto-optic effects in ultrathin films with Sagnac interferometry

Author:

Zhu X. D.12ORCID,Ko E. K.34,Kimbell G.5ORCID,Robinson J.5ORCID

Affiliation:

1. Department of Physics and Astronomy, University of California, Davis, California 95616, USA

2. Department of Optical Sciences and Engineering, Fudan University, Shanghai 200045, China

3. Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, Republic of Korea

4. Department of Physics and Astronomy, Seoul National University, Seoul 08826, Republic of Korea

5. Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, United Kingdom

Abstract

Sagnac interferometry is advantageous in measuring time-reversal-symmetry breaking effects in ferromagnetic and antiferromagnetic materials as it suppresses time-reversal symmetric birefringent effects that are ubiquitous and often overwhelming in optical detection systems. When its sensitivity is limited only by the amplifier noise in the photo-detector, one needs to optimize the optical power that returns to the detector. We demonstrate an experimental scheme that maximizes the returning optical power in a Sagnac interferometry when detecting the magneto-optic effect in ultrathin films. In this scheme, the optical beam bearing the Faraday effect on a thin film is reflected at a second surface coated with a highly reflective gold film. The gold film increases the returned optical power by a factor of 4–5. For a normal-incidence Sagnac interferometer, this scheme yields an increase in the signal-to-noise ratio by the same factor. For an oblique-incidence Sagnac interferometer, this scheme should yield an increase in the signal-to-noise ratio by a factor of 20–25. For illustration, this scheme is used to measure magnetization curves and Kerr rotation images of 4.5-unit-cell thick SrRuO3(001) grown on SrTiO3(001).

Funder

Engineering and Physical Sciences Research Council

Korea Basic Science Institute

Publisher

AIP Publishing

Subject

Instrumentation

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