Anisotropy and kinetics of the migration-induced layer formation in TeO2-Reference-Cited by-同舟云学术

Anisotropy and kinetics of the migration-induced layer formation in TeO2

Published:2020-02-14 Issue:6 Volume:127 Page:065106
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Kulikov A. G.¹²^ORCID,Blagov A. E.¹²^ORCID,Ilin A. S.³^ORCID,Marchenkov N. V.¹²^ORCID,Pisarevskii Yu. V.¹²,Kovalchuk M. V.¹²

Affiliation:

1. Shubnikov Institute of Crystallography of Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Leninsky prospekt 59, 119333 Moscow, Russia

2. National Research Center “Kurchatov Institute,” Pl. akademika Kurchatova 1, 123098 Moscow, Russia

3. Physics Department, Moscow State University, Leninskie Gory 1-2, 119991 Moscow, Russia

Funder

Ministry of Science and Higher Education within the State assignment FSRC Crystallography and Photonics RAS

Russian Foundation for Basic Research

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5131369

Reference39 articles.

1. The diffuse double layer in mixed electrolytes

2. Electrical double layer in solid electrolytes—theory: oxide electrolytes

3. Space Charge Layer Near the Surface of a Ferroelectric

4. Sur la constitution de la charge électrique à la surface d'un électrolyte

5. Migration-induced field-stabilized polar phase in strontium titanate single crystals at room temperature

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