Nanotomography based on hard x-ray microscopy with refractive lenses-Reference-Cited by-同舟云学术

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Nanotomography based on hard x-ray microscopy with refractive lenses

Published:2002-08-19 Issue:8 Volume:81 Page:1527-1529
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Schroer C. G.,Meyer J.,Kuhlmann M.,Benner B.,Günzler T. F.,Lengeler B.,Rau C.,Weitkamp T.,Snigirev A.,Snigireva I.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1501451

Reference18 articles.

1. High resolution tomography with chemical specificity

2. High resolution tomography with chemical specificity

3. A high-throughput x-ray microtomography system at the Advanced Photon Source

4. A high-throughput x-ray microtomography system at the Advanced Photon Source

5. A high-throughput x-ray microtomography system at the Advanced Photon Source

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