Periodicity in bimodal atomic force microscopy-Reference-Cited by-同舟云学术

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Periodicity in bimodal atomic force microscopy

Published:2015-07-28 Issue:4 Volume:118 Page:044905
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Lai Chia-Yun¹,Barcons Victor²^ORCID,Santos Sergio¹,Chiesa Matteo¹

Affiliation:

1. Laboratory for Energy and NanoScience (LENS), Institute Center for Future Energy (iFES), Masdar Institute of Science and Technology, Abu Dhabi, United Arab Emirates

2. Departament de Disseny i Programació de Sistemes Electrònics, UPC - Universitat Politècnica de Catalunya, Av. Bases, 61, 08242 Manresa (Barcelona), Spain

Funder

Masdar Institute of Science and Technology (Masdar Institute)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4927733

Reference42 articles.

1. Atomic Force Microscope

2. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

3. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

4. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy

5. Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy;ACS Nano;2021-12-01

2. Discrimination of adhesion and viscoelasticity from nanoscale maps of polymer surfaces using bimodal atomic force microscopy;Nanoscale;2021

3. Eigenvalues and dynamic stiffness of picket-shaped cantilevers;Sensors and Actuators A: Physical;2020-04

4. Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications;Chemical Society Reviews;2020

5. Biharmonic versus bimodal AFM: Numerical and experimental study on soft matter;Journal of Applied Physics;2019-09-07

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